- 专利标题: Two-tier defect scan management
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申请号: US17894794申请日: 2022-08-24
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公开(公告)号: US12105967B2公开(公告)日: 2024-10-01
- 发明人: Kishore Kumar Muchherla , Robert Loren O. Ursua , Sead Zildzic , Eric N. Lee , Jonathan S. Parry , Lakshmi Kalpana K. Vakati , Jeffrey S. McNeil
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Lowenstein Sandler LLP
- 主分类号: G06F3/06
- IPC分类号: G06F3/06
摘要:
A system can include a processing device operatively coupled with the one or more memory devices, to perform operations that include writing data to the one or more memory devices and performing one or more scan operations on a management unit containing the data to determine a current value of a chosen data state metric. Each scan operation can be performed using a corresponding predetermined read-time parameter value. The operations can include determining whether the current value of the chosen data state metric satisfies a criterion, and can also include, responsive to determining that the current value of the chosen data state metric satisfies the criterion, selecting a remedial operation by determining whether redundancy metadata is included in a fault tolerant data stripe on the one or more memory devices. The operations can also include performing the remedial operation with respect to the management unit.
公开/授权文献
- US20240069765A1 TWO-TIER DEFECT SCAN MANAGEMENT 公开/授权日:2024-02-29
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