- 专利标题: Spatially filtered talbot interferometer for wafer distortion measurement
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申请号: US16989157申请日: 2020-08-10
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公开(公告)号: US12104891B1公开(公告)日: 2024-10-01
- 发明人: Daniel Gene Smith , Goldie Lynne Goldstein , Hidemitsu Toba , Shunsuke Kibayashi , Katsura Otaki , Eric Peter Goodwin
- 申请人: Nikon Corporation
- 申请人地址: JP Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JP Tokyo
- 主分类号: G01B11/16
- IPC分类号: G01B11/16 ; G01B9/02 ; G01B9/02015 ; G01B11/24
摘要:
A system for measuring a target grating includes an illumination source, a reference transmission grating, a pupil filter, and a detector. The illumination source is disposed to generate an incident light beam that illuminates the reference transmission grating. The reference transmission grating splits the incident light beam into a plurality of diffraction orders. The plurality of diffraction orders interrogates a target grating. The reference transmission grating and the target grating are parallel. The pupil filter allows transmission of a subset of diffraction orders of light that has been diffracted and/or reflected from the target grating after being split again by passing through the reference transmission grating. The detector takes a measurement of the subset of diffraction orders of light after transmission through the pupil filter.
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