发明授权
- 专利标题: Calibration pod for robotic wafer carrier handling and calibration performed using same
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申请号: US17366661申请日: 2021-07-02
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公开(公告)号: US12068184B2公开(公告)日: 2024-08-20
- 发明人: Tzu-Chin Huang
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company., Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Lippes Mathias LLP
- 主分类号: H01L21/673
- IPC分类号: H01L21/673 ; H01L21/677 ; H01L21/68
摘要:
A calibration pod for calibrating a robotic wafer pod handling apparatus includes a pod body configured for handling by the robotic pod handling apparatus, at least one laser disposed on a bottom of the pod body, and a power module disposed on or in the pod body and operatively connected to power the at least one laser. In a manufacturing method, the pod body comprises a wafer carrier for carrying a cassette of semiconductor wafers, which has a bottom with a plurality of holes for aligning placement of the wafer carrier in a load port of a semiconductor device fabrication facility. The at least one laser here includes a plurality of lasers corresponding to the plurality of holes in the bottom of the wafer carrier, and each laser is mounted in a respective hole of the bottom of the wafer carrier.
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