Invention Grant
- Patent Title: Layer-based defect detection using normalized sensor data
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Application No.: US17375983Application Date: 2021-07-14
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Publication No.: US12053841B2Publication Date: 2024-08-06
- Inventor: Vivek R. Dave , Mark J. Cola
- Applicant: DIVERGENT TECHNOLOGIES, INC.
- Applicant Address: US CA Los Angeles
- Assignee: DIVERGENT TECHNOLOGIES, INC.
- Current Assignee: DIVERGENT TECHNOLOGIES, INC.
- Current Assignee Address: US CA Los Angeles
- Agency: FisherBroyles, LLP
- Main IPC: B23K31/12
- IPC: B23K31/12 ; B22F10/28 ; B22F10/31 ; B22F10/366 ; B22F10/38 ; B22F12/41 ; B22F12/49 ; B22F12/90 ; B23K26/03 ; B23K26/342 ; B33Y10/00 ; B33Y50/02 ; B41M5/26 ; G01J5/00 ; G01J5/04 ; G01J5/07 ; G01J5/48 ; G01J5/80 ; G01K11/00 ; G01N25/72

Abstract:
The disclosed embodiments relate to the monitoring and control of additive manufacturing. In particular, a method is shown for removing errors inherent in thermal measurement equipment so that the presence of errors in a product build operation can be identified and acted upon with greater precision. Instead of monitoring a grid of discrete locations on the build plane with a temperature sensor, the intensity, duration and in some cases position of each scan is recorded in order to characterize one or more build operations.
Public/Granted literature
- US20220001497A1 LAYER-BASED DEFECT DETECTION USING NORMALIZED SENSOR DATA Public/Granted day:2022-01-06
Information query
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