- 专利标题: Contact structure and method of forming the same
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申请号: US17219949申请日: 2021-04-01
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公开(公告)号: US12021030B2公开(公告)日: 2024-06-25
- 发明人: Wei Xu , Qingqing Wang , Jinxing Chen , Guanglong Fan , Huichao Liu
- 申请人: Yangtze Memory Technologies Co., Ltd.
- 申请人地址: CN Hubei
- 专利权人: Yangtze Memory Technologies Co., Ltd.
- 当前专利权人: Yangtze Memory Technologies Co., Ltd.
- 当前专利权人地址: CN Wuhan
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 主分类号: H01L23/535
- IPC分类号: H01L23/535 ; H01L21/3105 ; H01L21/768 ; H01L27/00 ; H10B43/27
摘要:
Aspects of the disclosure provide a semiconductor device. The semiconductor device can include a trench formed in a first dielectric layer, a trench filler layer that fills a portion of the trench, a conductive layer over the trench filler layer, and a second dielectric layer over the conductive layer. The second dielectric layer is disposed in the trench. The semiconductor device can also include a contact structure configured to connect to the conductive layer through a hole in the second dielectric layer.
公开/授权文献
- US20220285275A1 CONTACT STRUCTURE AND METHOD OF FORMING THE SAME 公开/授权日:2022-09-08
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