- 专利标题: Charge control circuit and abnormality detection system of secondary battery
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申请号: US17283689申请日: 2019-10-15
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公开(公告)号: US12009688B2公开(公告)日: 2024-06-11
- 发明人: Munehiro Kozuma , Takayuki Ikeda , Takanori Matsuzaki , Kei Takahashi , Mayumi Mikami , Shunpei Yamazaki
- 申请人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 申请人地址: JP Atsugi
- 专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人地址: JP Kanagawa-ken
- 代理机构: NIXON PEABODY LLP
- 代理商 Jeffrey L. Costellia
- 优先权: JP 18200636 2018.10.25 JP 18200638 2018.10.25
- 国际申请: PCT/IB2019/058757 2019.10.15
- 国际公布: WO2020/084386A 2020.04.30
- 进入国家日期: 2021-04-08
- 主分类号: H02J7/00
- IPC分类号: H02J7/00 ; G11C11/401 ; H01L27/06 ; H01M10/0525 ; H01M10/42 ; H01M10/48 ; H01M10/613 ; H01M10/615 ; H01M10/625 ; H01M10/633
摘要:
The safety is ensured in such a manner that with an abnormality detection system of a secondary battery, abnormality of a secondary battery is detected, for example, a phenomenon that lowers the safety of the secondary battery is detected early, and a user is warned or the use of the secondary battery is stopped. The abnormality detection system of the secondary battery determines whether the temperature of the secondary battery is within a temperature range in which normal operation can be performed on the basis of temperature data obtained with a temperature sensor. In the case where the temperature of the secondary battery is high, a cooling device is driven by a control signal from the abnormality detection system of the secondary battery. The abnormality detection system of the secondary battery includes at least a memory means. The memory means has a function of holding an analog signal and includes a transistor using an oxide semiconductor for a semiconductor layer.
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