- 专利标题: Phase frequency detector-based high-precision feedback frequency measurement apparatus and method
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申请号: US17816866申请日: 2022-08-02
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公开(公告)号: US11965919B2公开(公告)日: 2024-04-23
- 发明人: Xinglin Sun , Haojie Wu , Xinyue Tan , Lingyun Ye
- 申请人: Zhejiang University
- 申请人地址: CN Zhejiang
- 专利权人: Zhejiang University
- 当前专利权人: Zhejiang University
- 当前专利权人地址: CN Zhejiang
- 代理机构: WELSH FLAXMAN & GITLER LLC
- 优先权: CN 2111107112.3 2021.09.22
- 主分类号: G01R23/10
- IPC分类号: G01R23/10
摘要:
A phase frequency detector-based high-precision feedback frequency measurement apparatus and method: a Field Programmable Gate Array (FGPA) roughly measures a frequency fx of a measured time-frequency pulse by an equal-precision frequency measurement method; a Direct Digital Synthesizer (DDS) automatically synthesizes a frequency fx′ according to the fx roughly measured by the FPGA; the fx and the fx′ are sent to a phase frequency detector for performing phase frequency detection and then sent to the FPGA after passing through a charge pump, a low-pass filter circuit, and an (Analogue-to-Digital) A/D converter; the FPGA processes a frequency difference obtained by the phase frequency detector and then transmits the processed frequency difference to the DDS to form a negative feedback frequency measurement system so that the DDS continuously adjusts the fx′ according to a frequency difference measurement result until the output of the DDS is stable. Therefore, precise measurement of the time-frequency pulse to be measured is realized.
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