- 专利标题: Static random access memory with write assist circuit
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申请号: US17818386申请日: 2022-08-09
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公开(公告)号: US11948627B2公开(公告)日: 2024-04-02
- 发明人: Hidehiro Fujiwara , Chih-Yu Lin , Sahil Preet Singh , Hsien-Yu Pan , Yen-Huei Chen , Hung-Jen Liao
- 申请人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- 主分类号: G11C11/419
- IPC分类号: G11C11/419 ; G11C5/14 ; G11C7/12 ; G11C11/412 ; G11C11/418 ; H03K19/013
摘要:
A write assist circuit can include a control circuit and a voltage generator. The control circuit can be configured to receive memory address information associated with a memory write operation for memory cells. The voltage generator can be configured to provide a reference voltage to one or more bitlines coupled to the memory cells. The voltage generator can include two capacitive elements, where during the memory write operation, (i) one of the capacitive elements can be configured to couple the reference voltage to a first negative voltage, and (ii) based on the memory address information, both capacitive elements can be configured to cumulatively couple the reference voltage to a second negative voltage that is lower than the first negative voltage.
公开/授权文献
- US20220383947A1 STATIC RANDOM ACCESS MEMORY WITH WRITE ASSIST CIRCUIT 公开/授权日:2022-12-01
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