- 专利标题: Apparatus and method for a hierarchical beam tracer
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申请号: US17723772申请日: 2022-04-19
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公开(公告)号: US11880928B2公开(公告)日: 2024-01-23
- 发明人: Scott Janus , Prasoonkumar Surti , Karthik Vaidyanathan , Alexey Supikov , Gabor Liktor , Carsten Benthin , Philip Laws , Michael Doyle
- 申请人: INTEL CORPORATION
- 申请人地址: US CA Santa Clara
- 专利权人: INTEL CORPORATION
- 当前专利权人: INTEL CORPORATION
- 当前专利权人地址: US CA Santa Clara
- 代理机构: NICHOLSON DE VOS WEBSTER & ELLIOTT LLP
- 主分类号: G06T15/06
- IPC分类号: G06T15/06 ; G06T17/00 ; G06T1/60 ; G06T15/00
摘要:
Apparatus and method for a hierarchical beam tracer. For example, one embodiment of an apparatus comprises: a beam generator to generate beam data associated with a beam projected into a graphics scene; a bounding volume hierarchy (BVH) generator to generate BVH data comprising a plurality of hierarchically arranged BVH nodes; a hierarchical beam-based traversal unit to determine whether the beam intersects a current BVH node and, if so, to responsively subdivide the beam into N child beams to test against the current BVH node and/or to traverse further down the BVH hierarchy to select a new BVH node, wherein the hierarchical beam-based traversal unit is to iteratively subdivide successive intersecting child beams and/or to continue to traverse down the BVH hierarchy until a leaf node is reached with which at least one final child beam is determined to intersect; the hierarchical beam-based traversal unit to generate a plurality of rays within the final child beam; and intersection hardware logic to perform intersection testing for any rays intersecting the leaf node, the intersection testing to determine intersections between the rays intersecting the leaf node and primitives bounded by the leaf node.
公开/授权文献
- US20220327763A1 APPARATUS AND METHOD FOR A HIERARCHICAL BEAM TRACER 公开/授权日:2022-10-13
信息查询
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |
G06T15/06 | .光线跟踪 |