- 专利标题： System and method for using pulsed radio frequency (RF) signals and a modulated scattering probe (MSP) to enable measurements of distance to and planarity of a surface of a device under test (DUT)
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申请号： US17672400申请日： 2022-02-15
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公开(公告)号： US11835563B2公开(公告)日： 2023-12-05
- 发明人: Minh-Chau Huynh , Morten Damgaard , Christian Volf Olgaard
- 申请人： LitePoint Corporation
- 申请人地址： US CA San Jose
- 专利权人： LITEPOINT CORPORATION
- 当前专利权人： LITEPOINT CORPORATION
- 当前专利权人地址： US CA San Jose
- 代理机构： Burns & Levinson LLP
- 主分类号： G01R29/10
- IPC分类号： G01R29/10 ; H04B17/10 ; G01R29/08
摘要：
Systems and methods are provided for systems and methods for using pulsed radio frequency (RF) signals to stimulate one or more modulated scattering probes (MSPs) to enable measurements of distance to and planarity of a surface of a wireless device under test (DUT).
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