Invention Grant
- Patent Title: Integrated measurement systems and methods for synchronous, accurate materials property measurement
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Application No.: US17241472Application Date: 2021-04-27
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Publication No.: US11762050B2Publication Date: 2023-09-19
- Inventor: Houston Fortney , Noah Faust
- Applicant: Lake Shore Cryotronics, Inc.
- Applicant Address: US OH Westerville
- Assignee: Lake Shore Cryotronics, Inc.
- Current Assignee: Lake Shore Cryotronics, Inc.
- Current Assignee Address: US OH Westerville
- Agency: Calfee, Halter & Griswold LLP
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R19/25 ; G01R31/28 ; H03M1/08 ; H03M1/12 ; H03M1/18

Abstract:
A measurement system includes a source unit to provide a source signal to a sample and a voltage source and/or a current source and a memory. The system also includes a measurement unit configured to acquire from the sample an measurement signal that may be responsive to the source signal and a voltage measuring unit, a current measuring unit, and/or a capacitance measuring unit, and a memory. The system also includes a control unit including a digital signal processing unit; a source converter; a measurement converter. The system further includes a synchronization unit configured to synchronize clocks of the digital signal processing unit, the source converter, the measurement converter, the source unit, and the measurement unit; a calibration unit for calibrating aspects of the system including the control unit; and a reference voltage supply configured to supply a common reference voltage for the control unit.
Public/Granted literature
- US20210333348A1 INTEGRATED MEASUREMENT SYSTEMS AND METHODS FOR SYNCHRONOUS, ACCURATE MATERIALS PROPERTY MEASUREMENT Public/Granted day:2021-10-28
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