Invention Grant
- Patent Title: Semiconductor device and method of inspecting the same
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Application No.: US16386774Application Date: 2019-04-17
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Publication No.: US11715701B2Publication Date: 2023-08-01
- Inventor: Yuusuke Takano , Yoshiaki Goto , Takeshi Watanabe , Takashi Imoto
- Applicant: Toshiba Memory Corporation
- Applicant Address: JP Tokyo
- Assignee: Kioxia Corporation
- Current Assignee: Kioxia Corporation
- Current Assignee Address: JP Tokyo
- Agency: Kim & Stewart LLP
- Priority: JP 13187132 2013.09.10
- Main IPC: H01L23/552
- IPC: H01L23/552 ; H01L21/66 ; H01L23/00 ; H01L23/31 ; G01R31/28

Abstract:
According to one embodiment, a semiconductor device includes a wiring board that has a first surface and a second surface opposed to the first surface, a semiconductor chip provided on the first surface, external connection terminals provided on the second surface, a sealing resin layer provided on the first surface, and a conductive shield layer that covers at least a portion of a side surface of the wiring board and the sealing resin layer. The wiring board includes a first ground wire that is electrically connected to the conductive shield layer, and a second ground wire that is electrically connected to the conductive shield layer and is electrically insulated from the first ground wire.
Public/Granted literature
- US20190244912A1 SEMICONDUCTOR DEVICE AND METHOD OF INSPECTING THE SAME Public/Granted day:2019-08-08
Information query
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