- 专利标题: Package structure and fabricating method thereof
-
申请号: US17685378申请日: 2022-03-03
-
公开(公告)号: US11705407B2公开(公告)日: 2023-07-18
- 发明人: Kuan-Yu Huang , Sung-Hui Huang , Shang-Yun Hou
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: JCIPRNET
- 主分类号: H01L23/00
- IPC分类号: H01L23/00 ; H01L21/56 ; H01L21/78 ; H01L23/31 ; H01L23/48 ; H01L23/498 ; H01L25/065 ; H01L25/00
摘要:
A semiconductor device including a first semiconductor die, a second semiconductor die, an insulating encapsulation and a warpage control pattern is provided. The first semiconductor die includes an active surface and a rear surface opposite to the active surface. The second semiconductor die is disposed on the active surface of the first semiconductor die. The insulating encapsulation is disposed on the active surface of the first semiconductor die and laterally encapsulates the second semiconductor die. The warpage control pattern is disposed on and partially covers the rear surface of the first semiconductor die.
公开/授权文献
- US20220254736A1 PACKAGE STRUCTURE AND FABRICATING METHOD THEREOF 公开/授权日:2022-08-11
信息查询
IPC分类: