Invention Grant
- Patent Title: Gamma debugging method and apparatus
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Application No.: US17797830Application Date: 2021-10-22
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Publication No.: US11688340B2Publication Date: 2023-06-27
- Inventor: Yuanzhang Zhu , Guoqiang Wu , Ting Han
- Applicant: Chengdu BOE Optoelectronics Technology Co., Ltd. , BOE Technology Group Co., Ltd.
- Applicant Address: CN Sichuan
- Assignee: Chengdu BOE Optoelectronics Technology Co., Ltd.,BOE Technology Group Co., Ltd.
- Current Assignee: Chengdu BOE Optoelectronics Technology Co., Ltd.,BOE Technology Group Co., Ltd.
- Current Assignee Address: CN Sichuan; CN Beijing
- Agency: IPro, PLLC
- Priority: CN 2011245631.1 2020.11.10
- International Application: PCT/CN2021/125810 2021.10.22
- International Announcement: WO2022/100416A 2022.05.19
- Date entered country: 2022-08-05
- Main IPC: G09G3/3225
- IPC: G09G3/3225 ; G09G3/20

Abstract:
A gamma debugging method and a gamma debugging apparatus are provided. The gamma debugging method includes: selecting a test display region in a first display region, performing gamma debugging on test sub-pixels to obtain a first gamma data set; controlling all sub-pixels in the test display region and all sub-pixels in a second display region to emit light, and detecting a target luminance and a target chrominance of the test display region that correspond to a corresponding grayscale; performing gamma debugging on the second display region to obtain a second gamma data set; obtaining, based on the second gamma data set, the first gamma data set and the predetermined gamma data set, a third gamma data set applied to the second display region.
Public/Granted literature
- US20230058388A1 GAMMA DEBUGGING METHOD AND APPARATUS Public/Granted day:2023-02-23
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