Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US17159080Application Date: 2021-01-26
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Publication No.: US11676920B2Publication Date: 2023-06-13
- Inventor: Da-Jun Lin , Bin-Siang Tsai , Fu-Yu Tsai
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Main IPC: H01L23/00
- IPC: H01L23/00

Abstract:
A method for fabricating a semiconductor device includes the steps of first forming an aluminum (Al) pad on a substrate, forming a passivation layer on the substrate and an opening exposing the Al pad, forming a cobalt (Co) layer in the opening and on the Al pad, bonding a wire onto the Co layer, and then performing a thermal treatment process to form a Co—Pd alloy on the Al pad.
Public/Granted literature
- US20220238468A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2022-07-28
Information query
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