- 专利标题: Gate cut structure and method of forming the same
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申请号: US17164643申请日: 2021-02-01
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公开(公告)号: US11532744B2公开(公告)日: 2022-12-20
- 发明人: Chun-Yuan Chen , Pei-Yu Wang , Huan-Chieh Su , Yi-Hsun Chiu , Cheng-Chi Chuang , Ching-Wei Tsai , Kuan-Lun Cheng , Chih-Hao Wang
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Haynes and Boone, LLP
- 主分类号: H01L29/78
- IPC分类号: H01L29/78 ; H01L29/423 ; H01L29/66 ; H01L29/06
摘要:
Semiconductor devices and methods of forming the same are provided. A semiconductor device according to the present disclosure includes a first gate structure disposed over a first backside dielectric feature, a second gate structure disposed over a second backside dielectric feature, a gate cut feature extending continuously from between the first gate structure and the second gate structure to between the first backside dielectric feature and the second backside dielectric feature, and a liner disposed between the gate cut feature and the first backside dielectric feature and between the gate cut feature and the second backside dielectric feature.
公开/授权文献
- US20220131004A1 GATE CUT STRUCTURE AND METHOD OF FORMING THE SAME 公开/授权日:2022-04-28
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