- 专利标题: Method of forming image sensor device
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申请号: US17183871申请日: 2021-02-24
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公开(公告)号: US11532662B2公开(公告)日: 2022-12-20
- 发明人: Chia-Yu Wei , Yen-Liang Lin , Kuo-Cheng Lee , Hsun-Ying Huang , Hsin-Chi Chen
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Maschoff Brennan
- 主分类号: H01L27/146
- IPC分类号: H01L27/146 ; H01L31/103 ; H01L31/0352 ; H01L31/0336 ; H01L31/028 ; H01L31/0312 ; H01L31/0304 ; H01L31/0296
摘要:
A method includes providing a semiconductor substrate having a front side surface and a back side surface opposite to the front side surface. A photosensitive region of the semiconductor substrate is etched to form a recess. A semiconductor material is deposited on the semiconductor substrate to form a radiation sensing member filling the recess. The semiconductor material has an optical band gap energy smaller than 1.77 eV. A device layer is formed over the front side surface of the semiconductor substrate and the radiation sensing member. A trench isolation is formed in an isolation region of the semiconductor substrate and extending from the back side surface of the semiconductor substrate.
公开/授权文献
- US20210202564A1 METHOD OF FORMING IMAGE SENSOR DEVICE 公开/授权日:2021-07-01
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