发明授权
- 专利标题: Analyzing method
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申请号: US16430179申请日: 2019-06-03
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公开(公告)号: US11532470B2公开(公告)日: 2022-12-20
- 发明人: Pradip Girdhar Chaudhari , Che-Hui Lee , Wen-Cheng Yang
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: WPAT
- 代理商 Anthony King
- 主分类号: G01B7/004
- IPC分类号: G01B7/004 ; G01D5/14 ; H01J37/34 ; G01B7/00
摘要:
A method includes providing a jig including a predetermined center and a magnetron installed on the jig; rotating the magnetron and obtaining a measured first magnetic flux density at the predetermined center of the jig; defining a first area of the magnetron based on the measured first magnetic flux density; rotating the magnetron and measuring a plurality of second magnetic flux densities within the first area of the magnetron; deriving a measured second magnetic flux density among the plurality of second magnetic flux densities; comparing the measured second magnetic flux density with a predetermined threshold; and performing an operation based on the comparison.
公开/授权文献
- US20200168444A1 ANALYZING METHOD 公开/授权日:2020-05-28
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