- 专利标题: Method of fabricating a SiC resonator
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申请号: US16368737申请日: 2019-03-28
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公开(公告)号: US11469732B2公开(公告)日: 2022-10-11
- 发明人: Raviv Perahia , Logan D. Sorenson , Lian X. Huang , David T. Chang , Makena S. White , Jeremy Bregman
- 申请人: HRL Laboratories, LLC
- 申请人地址: US CA Malibu
- 专利权人: HRL Laboratories, LLC
- 当前专利权人: HRL Laboratories, LLC
- 当前专利权人地址: US CA Malibu
- 代理机构: Ladas & Parry, LLP
- 主分类号: H03H3/02
- IPC分类号: H03H3/02 ; H03H9/205 ; H03H9/02 ; H03H9/05 ; H03H9/13 ; H03H9/17 ; H03H9/15
摘要:
A method of making a SiC resonator includes forming a layer of an oxide material on a relatively thick wafer of SiC; bonding the layer of oxide material on the relatively thick wafer of SiC to a handle wafer having at least an oxide exterior surface, the resulting bond being substantially free of voids; planarizing the relatively thick wafer of SiC to a desired thickness; forming top and bottom electrodes on the wafer of SiC wafer to define a SiC wafer resonator portion; and forming a trench around the top and bottom electrodes, the tench completely penetrating the planarized wafer of SiC around a majority of a distance surrounding said top and bottom electrodes, except for one or more tether regions of the planarized wafer of SiC which remain physically coupled a remaining portion the SiC wafer resonator portion which defines a frame formed of the planarized wafer of SiC surrounding the SiC wafer resonator portion.
公开/授权文献
- US20190305744A1 METHOD OF FABRICATING A SIC RESONATOR 公开/授权日:2019-10-03
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