Invention Grant
- Patent Title: Semicondcutor device and manufacturing method thereof
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Application No.: US17355142Application Date: 2021-06-22
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Publication No.: US11462548B1Publication Date: 2022-10-04
- Inventor: Chao-Wen Lay
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agency: CKC & Partners Co., LLC
- Main IPC: H01L27/108
- IPC: H01L27/108

Abstract:
A semiconductor device includes a semiconductor structure, a first dielectric layer and a plurality of multilayer stacks. The semiconductor structure includes conductive features therein. The first dielectric layer is on the semiconductor structure. The multilayer stacks are arranged on the first dielectric layer. Each of the multilayer stacks comprises a semiconductor layer over the first dielectric layer, a conductive layer over the semiconductor layer and a second dielectric layer over the conductive layer. The second dielectric layer includes a top portion and a bottom portion wider than the top portion.
Information query
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