- 专利标题: Semiconductor device structure with an underground interconnection embedded into a silicon substrate
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申请号: US17065543申请日: 2020-10-08
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公开(公告)号: US11417369B2公开(公告)日: 2022-08-16
- 发明人: Chao-Chun Lu , Li-Ping Huang
- 申请人: Etron Technology, Inc.
- 申请人地址: TW Hsinchu
- 专利权人: Etron Technology, Inc.
- 当前专利权人: Etron Technology, Inc.
- 当前专利权人地址: TW Hsinchu
- 代理商 Winston Hsu
- 主分类号: H01L27/108
- IPC分类号: H01L27/108 ; G11C5/06 ; H01L29/06
摘要:
A semiconductor device structure includes a silicon substrate, a transistor, and an interconnection. The silicon substrate has a silicon surface. The transistor includes a gate structure, a first conductive region, a second conductive region, and a channel under the silicon surface. The interconnection is extended beyond the transistor and coupled to the first conductive region of the transistor. The interconnection is disposed under the silicon surface and isolated from the silicon substrate by an isolation region.
公开/授权文献
- US20210201960A1 SEMICONDUCTOR DEVICE STRUCTURE 公开/授权日:2021-07-01
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