- 专利标题: Method of measuring the wall thickness of an article and an apparatus for making such measurements
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申请号: US16320786申请日: 2017-07-13
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公开(公告)号: US11415411B2公开(公告)日: 2022-08-16
- 发明人: Srichand Hinduja
- 申请人: ELE ADVANCED TECHNOLOGIES LIMITED
- 申请人地址: GB Lancashire
- 专利权人: ELE ADVANCED TECHNOLOGIES LIMITED
- 当前专利权人: ELE ADVANCED TECHNOLOGIES LIMITED
- 当前专利权人地址: GB Lancashire
- 代理机构: Quinn IP Law
- 优先权: GB1612867 20160725
- 国际申请: PCT/GB2017/052057 WO 20170713
- 国际公布: WO2018/020215 WO 20180201
- 主分类号: G01B17/02
- IPC分类号: G01B17/02 ; G01B5/008 ; G01C3/08
摘要:
A method of (measuring the waif thickness of an article comprising the steps of (a) providing an inspection machine having an inspection machine co-ordinate system associated therewith, the inspection machine comprising a thickness measuring probe; (b) providing an article in a first position relative to the inspection machine; (c) measuring a plurality of surface points on at least a portion of the surface of the article; (d) modelling the at least a portion of the surface of the article from the measured surface points to produce a surface model; (e) generating a probe path from the surface model in an article coordinate system fixed relative to the article; (f) transforming the probe path to the inspection machine co-ordinate system; and, (g) moving the thickness measuring probe along the probe path whilst making a plurality of spaced apart wall thickness measurements of the article.
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