- 专利标题: Method and system for correlating optical images with scanning electron microscopy images
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申请号: US16508778申请日: 2019-07-11
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公开(公告)号: US11244442B2公开(公告)日: 2022-02-08
- 发明人: Hucheng Lee , Lisheng Gao , Jan Lauber , Yong Zhang
- 申请人: KLA-Tencor Corporation
- 申请人地址: US CA Milpitas
- 专利权人: KLA-Tencor Corporation
- 当前专利权人: KLA-Tencor Corporation
- 当前专利权人地址: US CA Milpitas
- 代理机构: Suiter Swantz pc llo
- 主分类号: G06T7/00
- IPC分类号: G06T7/00 ; G06T5/00 ; H01J37/22 ; H01J37/28
摘要:
The correlation of optical images with SEM images includes acquiring a full optical image of a sample by scanning the sample with an optical inspection sub-system, storing the full optical image, identifying a location of a feature-of-interest present in the full optical image with an additional sources, acquiring an SEM image of a portion of the sample that includes the feature at the identified location with a SEM tool, acquiring an optical image portion at the location identified by the additional source, the image portions including a reference structure, correlating the image portion and the SEM image based on the presence of the feature-of-interest and the reference structure in both the image portions and the SEM image, and transferring a location of the feature-of-interest in the SEM image into the coordinate system of the image portion of the full optical image to form a corrected optical image.
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