发明授权
- 专利标题: Microscope apparatus, observation method, and microscope apparatus-control program
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申请号: US16515555申请日: 2019-07-18
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公开(公告)号: US11243386B2公开(公告)日: 2022-02-08
- 发明人: Kenta Matsubara
- 申请人: FUJIFILM Corporation
- 申请人地址: JP Tokyo
- 专利权人: FUJIFILM Corporation
- 当前专利权人: FUJIFILM Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: JPJP2017-034680 20170227
- 主分类号: G02B21/00
- IPC分类号: G02B21/00 ; G02B21/02 ; G02B21/24 ; G02B21/26
摘要:
There are provided a microscope apparatus, an observation method, and a microscope apparatus-control program that can more efficiently perform auto-focus control and can shorten an imaging time in a case where a culture vessel is to be scanned by an image forming optical system and the auto-focus control is to be performed at each observation position. Focus information of a culture vessel is detected by a first displacement sensor and a second displacement sensor while a stage is moved to a scanning measurement position from an initial set position, and an auto-focus control unit performs auto-focus control at every observation position on the basis of the focus information in a case where the stage has been moved to the scanning measurement position.
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