Invention Grant
- Patent Title: Bonding structure of e chuck to aluminum base configuration
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Application No.: US16876326Application Date: 2020-05-18
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Publication No.: US11192323B2Publication Date: 2021-12-07
- Inventor: Vijay D. Parkhe , Roger Alan Lindley
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan, LLP
- Main IPC: B32B3/24
- IPC: B32B3/24 ; B32B3/26 ; B32B5/18 ; H01L21/683 ; H01L21/687 ; B32B7/12

Abstract:
The present disclosure is a method of bonding an electrostatic chuck to a temperature control base. According to the embodiments, a bonding layer is formed between a dielectric body comprising the electrostatic chuck and a temperature control base. A flow aperture extends through the dielectric body and is aligned with a flow aperture in the temperature control base. The bonding layer is also configured with an opening that aligns with apertures in the dielectric body and the temperature control base. In one aspect, a porous plug may be disposed within the flow aperture to protect the bonding layer. In another aspect, a seal is disposed within the flow aperture to seal off the boding layer from gases in the flow aperture.
Public/Granted literature
- US20200276785A1 BONDING STRUCTURE OF E CHUCK TO ALUMINUM BASE CONFIGURATION Public/Granted day:2020-09-03
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