Invention Grant
- Patent Title: RF tuning systems including tuning circuits having impedances for setting and adjusting parameters of electrodes in electrostatic chucks
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Application No.: US16052877Application Date: 2018-08-02
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Publication No.: US11183368B2Publication Date: 2021-11-23
- Inventor: David French , Vincent E. Burkhart , Karl Frederick Leeser , Liang Meng
- Applicant: LAM RESEARCH CORPORATION
- Applicant Address: US CA Fremont
- Assignee: LAM RESEARCH CORPORATION
- Current Assignee: LAM RESEARCH CORPORATION
- Current Assignee Address: US CA Fremont
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Main IPC: H01J37/32
- IPC: H01J37/32 ; C23C16/455 ; H01L21/683 ; H05B1/02 ; H05H1/24

Abstract:
A substrate processing system for processing a substrate within a processing chamber is provided and includes a source terminal, a substrate support, and a tuning circuit. The substrate support holds the substrate and includes first and second electrodes, which receive power from a power source via the source terminal. The tuning circuit is connected to the first electrode or the second electrode. The tuning circuit is allocated for tuning signals provided to the first electrode. The tuning circuit includes at least one of a first impedance set or a second impedance set. The first impedance set is serially connected between the first electrode and the power source and receives a first signal from the power source via the source terminal. The second impedance set is connected between an output of the power source and a reference terminal and receives the first signal from the power source via the source terminal.
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