- 专利标题: Bi-spectral detector
-
申请号: US17258089申请日: 2019-06-21
-
公开(公告)号: US11171168B2公开(公告)日: 2021-11-09
- 发明人: Alexandre Delga , Jean-Luc Reverchon
- 申请人: THALES , COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- 申请人地址: FR Courbevoie; FR Paris
- 专利权人: THALES,COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- 当前专利权人: THALES,COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- 当前专利权人地址: FR Courbevoie; FR Paris
- 优先权: FR18/00717 20180705
- 国际申请: PCT/EP2019/066468 WO 20190621
- 国际公布: WO2020/007622 WO 20200109
- 主分类号: H01L27/146
- IPC分类号: H01L27/146 ; H01L27/14
摘要:
An optical detector that is sensitive in at least two infrared wavelength ranges: first spectral band and second spectral band; and having a set of pixels, comprising: an absorbent structure disposed on a lower face of a substrate and comprising a stack of at least one absorbent layer made of semi-conductor material; the detector further comprising a plurality of dielectric resonators on the upper surface of said substrate forming an upper surface metasurface, the metasurface configured to diffuse, deflect and focus in the pixels of the detector in a resonant manner, when illuminated by the incident light, a first beam having at least one first wavelength included in the first spectral band and a second beam having at least one second wavelength included in the second band, the metasurface also being configured so that said first and second beams are focused on different pixels of the detector.
公开/授权文献
- US20210288095A1 IMPROVED BI-SPECTRAL DETECTOR 公开/授权日:2021-09-16
信息查询
IPC分类: