- 专利标题: Inspection apparatus, inspection system, and aligning method
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申请号: US16619260申请日: 2018-04-16
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公开(公告)号: US11169206B2公开(公告)日: 2021-11-09
- 发明人: Jun Fujihara , Masanori Ueda , Kentaro Konishi
- 申请人: TOKYO ELECTRON LIMITED
- 申请人地址: JP Tokyo
- 专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人地址: JP Tokyo
- 代理机构: Fenwick & West LLP
- 优先权: JPJP2017-110744 20170605
- 国际申请: PCT/JP2018/015715 WO 20180416
- 国际公布: WO2018/225384 WO 20181213
- 主分类号: G01R31/20
- IPC分类号: G01R31/20 ; G01R31/26 ; G01R31/28 ; G01R1/067 ; G01R1/073
摘要:
The present disclosure is provided with a probe card and a transfer stage for transferring an inspection target toward the probe card. The transfer stage is provided with a chuck top on which the inspection target is mounted, an aligner configured to be contacted to or separated from the chuck top, and an aligning mechanism for aligning the chuck top with the aligner. The aligning mechanism has radially-expandable positioning pins at a plurality of positions on the upper surface of the aligner, and pin insertion members at positions on the lower surface of the chuck top corresponding to the positioning pins, the pin insertion members having pin insertion holes of which diameters are larger than those of the positioning pins that are not radially expanded. The chuck top is aligned with the aligner by inserting the positioning pins into the pin insertion holes and radially expanding the positioning pins.
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