- 专利标题: Calculation system, calculation method, program, and target
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申请号: US16620775申请日: 2017-06-14
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公开(公告)号: US11132789B2公开(公告)日: 2021-09-28
- 发明人: Yuichi Ohshima
- 申请人: NIKON-TRIMBLE CO., LTD.
- 申请人地址: JP Tokyo
- 专利权人: NIKON-TRIMBLE CO., LTD.
- 当前专利权人: NIKON-TRIMBLE CO., LTD.
- 当前专利权人地址: JP Tokyo
- 代理机构: Carstens & Cahoon, LLP
- 代理商 Brandon V. Zuniga; James R. Gourley
- 国际申请: PCT/JP2017/022024 WO 20170614
- 国际公布: WO2018/229917 WO 20181220
- 主分类号: G06T7/70
- IPC分类号: G06T7/70 ; G06T7/00 ; G06T7/60
摘要:
A target including a reference object of a known size is prepared. The reference object from target image data, which is generated by photographing the target using a survey instrument, is detected through image processing to calculate first size data on dimensions of the reference object. A defect from external appearance image data, which is generated by photographing an external appearance of a structure using the survey instrument, is detected through image processing to calculate defect data on dimensions of the defect. The first size data is compared with second size data on actual dimensions of the reference object to calculate correction data, which is used to correct the defect data.
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