Invention Grant
- Patent Title: Method and electronic testing device for determining optimal test case for testing user equipment
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Application No.: US16665145Application Date: 2019-10-28
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Publication No.: US11115137B2Publication Date: 2021-09-07
- Inventor: Palani Kumar Subramanian , Kumud Sinha , Tushar Vrind
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: IN201941031342 20190802
- Main IPC: H04W24/08
- IPC: H04W24/08 ; H04B17/15 ; H04B17/29

Abstract:
A method is provided. The method includes determining, in a determination by an electronic testing device, one or more locations in a cellular network where a test case is to be executed, a time at which the test case is to be executed at the one or more locations, a number of times the test case is to be executed at the one or more locations, or a type of a test equipment on which the test case is to be executed. A test context for testing a user equipment is determined based on a result of the determination. An optimal test case is determined from a test case repository, based on the test context, and the optimal test case is executed.
Public/Granted literature
- US20210036788A1 METHOD AND ELECTRONIC TESTING DEVICE FOR DETERMINING OPTIMAL TEST CASE FOR TESTING USER EQUIPMENT Public/Granted day:2021-02-04
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