Invention Grant
- Patent Title: Test board and a device testing apparatus using the test board
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Application No.: US16573460Application Date: 2019-09-17
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Publication No.: US10996958B2Publication Date: 2021-05-04
- Inventor: Jong Jin An , Jae Hyun Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2019-0015834 20190212
- Main IPC: G06F9/38
- IPC: G06F9/38 ; G01R31/28

Abstract:
A test board is provided including a first branch line including a first portion which receives an input signal and a second portion opposite to the first portion. A plurality of second branch lines branch from the first branch line. Each of the second branch lines include a third portion connected to the second portion of the first branch line and a fourth portion connected to the third portion. A first characteristic impedance of the first portion of the first branch line is different from a second characteristic impedance of the second portion of the first branch line. A third characteristic impedance of the third portions of each of the second branch lines is different from a fourth characteristic impedance of the fourth portions of each of the second branch lines. The second characteristic impedance is equal to a combined characteristic impedance of the third portions of each of the second branch lines.
Public/Granted literature
- US20200257536A1 TEST BOARD AND A DEVICE TESTING APPARATUS USING THE TEST BOARD Public/Granted day:2020-08-13
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