- 专利标题: Inspection apparatus, inspection method, and inverter apparatus
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申请号: US16112580申请日: 2018-08-24
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公开(公告)号: US10958157B2公开(公告)日: 2021-03-23
- 发明人: Shigen Yasunaka , Shinji Takakura
- 申请人: KABUSHIKI KAISHA TOSHIBA
- 申请人地址: JP Tokyo
- 专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人地址: JP Tokyo
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner L.L.P.
- 优先权: JPJP2018-51223 20180319
- 主分类号: H02P25/22
- IPC分类号: H02P25/22 ; H02P23/14 ; H02P21/14 ; H02M1/32 ; H02M7/5387 ; G01R31/42 ; H02P27/06
摘要:
According to an embodiment, an inspection apparatus inspects an inverter circuit including three pairs of arms. The apparatus includes a current controller and a control signal generator. The current controller generates a control output for controlling a current to be output by the inverter circuit. The control output enables the current to approach a target value of the current. The control signal generator generates a first control signal for controlling ON/OFF of a first arm as one of the three pairs of arms based on the control output, a second control signal for fixing a second arm paired with the first arm, in an OFF-state, and a third control signal for fixing at least part of arms other than the first arm and the second arm in an ON-state.
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