Invention Grant
- Patent Title: Electrical testing method of interposer
-
Application No.: US15972837Application Date: 2018-05-07
-
Publication No.: US10950507B2Publication Date: 2021-03-16
- Inventor: Lu-Yi Chen , Chi-Hsin Chiu , Shih-Kuang Chiu
- Applicant: Siliconware Precision Industries Co., Ltd.
- Applicant Address: TW Taichung
- Assignee: Siliconware Precision Industries Co., Ltd.
- Current Assignee: Siliconware Precision Industries Co., Ltd.
- Current Assignee Address: TW Taichung
- Agency: Mintz Levin Cohn Ferris Glovsky
- Agent Peter F. Corless; Steven M. Jensen
- Priority: TW101109806 20120322
- Main IPC: G01R1/073
- IPC: G01R1/073 ; H01L21/66 ; H01L23/498 ; H01L21/48

Abstract:
An interposer is provided which includes: a substrate having a first surface with a plurality of first conductive pads and a second surface opposite to the first surface, the second surface having a plurality of second conductive pads; a plurality of conductive through holes penetrating the first and second surfaces of the substrate and electrically connecting the first and second conductive pads; and a first removable electrical connection structure formed on the first surface and electrically connecting a portion of the first conductive pads so as to facilitate electrical testing of the interposer.
Public/Granted literature
- US20180254227A1 ELECTRICAL TESTING METHOD OF INTERPOSER Public/Granted day:2018-09-06
Information query