- 专利标题: Storage device with test interface
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申请号: US16514685申请日: 2019-07-17
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公开(公告)号: US10930366B2公开(公告)日: 2021-02-23
- 发明人: Stephen Hanna
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Lowenstein Sandler LLP
- 主分类号: G11C29/48
- IPC分类号: G11C29/48 ; G06F13/16
摘要:
An example system comprises: a master bus electrically coupled to a master multiplexer controlled by a test mode signal selecting between a master physical interface (PHY) and a slave bus of a plurality of slave buses, wherein each slave bus is electrically coupled to a respective slave multiplexer controlled by the test mode signal selecting between a respective slave PHY and the master bus; a plurality of memory components, wherein each memory component of the plurality of memory components is electrically coupled to one of: the master bus or a slave bus of the plurality of slave buses; and a memory test interface electrically coupled to the master bus.
公开/授权文献
- US20210020259A1 STORAGE DEVICE WITH TEST INTERFACE 公开/授权日:2021-01-21
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