- 专利标题： Spectrum analysis apparatus, fine particle measurement apparatus, and method and program for spectrum analysis or spectrum chart display
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申请号： US14342587申请日： 2012-09-12
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公开(公告)号： US10782224B2公开(公告)日： 2020-09-22
- 发明人: Nao Nitta
- 申请人： Nao Nitta
- 申请人地址： JP Tokyo
- 专利权人： Sony Corporation
- 当前专利权人： Sony Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： K&L Gates LLP
- 优先权： com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6ef0ef67
- 国际申请： PCT/JP2012/005780 WO 20120912
- 国际公布： WO2013/038660 WO 20130321
- 主分类号： G01N33/48
- IPC分类号： G01N33/48 ; G01N33/50 ; G01N15/14 ; G01J3/02 ; G01J3/28 ; G01N21/25 ; G01N15/10
摘要：
Provided is a spectrum analysis apparatus including a processing unit configured to generate analysis data using an analysis function in which a linear function and a logarithmic function are included as function elements and an intensity value is set as a variable from measurement data including the intensity value of light acquired by detecting the light from a measurement target object using a plurality of light-receiving elements having different detection wavelength bands.
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