Invention Grant
- Patent Title: Methods of fabricating semiconductor devices
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Application No.: US16711833Application Date: 2019-12-12
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Publication No.: US10748909B2Publication Date: 2020-08-18
- Inventor: Jinwon Ma , Jun-Noh Lee , Dong-Hyun Im , Youngseok Kim , Kongsoo Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@91b8214
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L21/768 ; H01L23/485 ; H01L23/532

Abstract:
A method of fabricating a semiconductor device includes forming an interlayer insulating structure on a substrate, forming a contact hole that penetrates the interlayer insulating structure to expose the substrate, forming an amorphous silicon layer including a first portion and a second portion, the first portion covering a top surface of the substrate exposed by the contact hole, the second portion covering a sidewall of the contact hole, providing hydrogen atoms into the amorphous silicon layer, and crystallizing the first portion using the substrate as a seed.
Public/Granted literature
- US20200119021A1 METHODS OF FABRICATING SEMICONDUCTOR DEVICES Public/Granted day:2020-04-16
Information query
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