- 专利标题: Device and method for calculating area to be out of inspection target of inspection system
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申请号: US15926558申请日: 2018-03-20
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公开(公告)号: US10724963B2公开(公告)日: 2020-07-28
- 发明人: Junichirou Yoshida , Fumikazu Warashina
- 申请人: FANUC CORPORATION
- 申请人地址: JP Yamanashi
- 专利权人: FANUC CORPORATION
- 当前专利权人: FANUC CORPORATION
- 当前专利权人地址: JP Yamanashi
- 代理机构: Hauptman Ham, LLP
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@60d3d7e8
- 主分类号: G01N21/88
- IPC分类号: G01N21/88 ; G06T7/00 ; B25J9/16 ; G01N21/95
摘要:
A device capable of easily defining an area other than a surface to be inspected of a workpiece. The device includes a drawing acquisition section for acquiring drawing data of the workpiece; a designation reception section for receiving specification of the surface to be inspected of the workpiece in the drawing data; and a non-inspection area calculation section for calculating, as a non-inspection area, an image area other than the surface to be inspected in an image in a view of the imaging section when the workpiece and the imaging section are positioned at an imaging position at which at least a part of the surface to be inspected as specified falls within the view of the imaging section.
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