- 专利标题: Alignment method based on pixel color and alignment system for using the same
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申请号: US15752650申请日: 2018-01-17
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公开(公告)号: US10692449B2公开(公告)日: 2020-06-23
- 发明人: Daobo Yan
- 申请人: SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD
- 申请人地址: CN Shenzhen
- 专利权人: SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- 当前专利权人: SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- 当前专利权人地址: CN Shenzhen
- 代理机构: Hemisphere Law, PLLC
- 代理商 Zhigang Ma
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@61e267ee
- 国际申请: PCT/CN2018/073044 WO 20180117
- 国际公布: WO2019/127703 WO 20190704
- 主分类号: G09G3/36
- IPC分类号: G09G3/36 ; G09G3/20
摘要:
An alignment method based on pixel color and an alignment system for using the same is disclosed. The method includes: Step S1: retrieving a photoresistance eigenvalue of each subcolor resist illuminated by a light source and setting a pixel threshold according to the photoresistance eigenvalue; Step S2: performing a binarization process on a pixel according to the pixel threshold to obtain a binary pixel; and Step S3: calculating an alignment position according to the binary pixel and aligning the color resist according to the alignment position. The present invention avoids the distribution of metal traces and patterns of a color filter on array (COA) product, improves the stability of measuring the COA product, aligns pixel with different shapes, and edits the computing logic for measured positions. When the shape of the pixel is irregular, the reasonable logic is selected to define the measured positions.
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