Invention Grant
- Patent Title: Infrared sensor design using an epoxy film as an infrared absorption layer
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Application No.: US15447932Application Date: 2017-03-02
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Publication No.: US10570006B2Publication Date: 2020-02-25
- Inventor: Ricky Alan Jackson , Walter Baker Meinel , Kalin Valeriev Lazarov , Brian E. Goodlin
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Jacqueline J. Garner; Charles A. Brill; Frank D. Cimino
- Main IPC: B81B7/00
- IPC: B81B7/00 ; H01L27/144 ; B81C1/00

Abstract:
A MEMS IR sensor, with a cavity in a substrate underlapping an overlying layer and a temperature sensing component disposed in the overlying layer over the cavity, may be formed by forming an IR-absorbing sealing layer on the overlying layer so as to cover access holes to the cavity. The sealing layer is may include a photosensitive material, and the sealing layer may be patterned using a photolithographic process to form an IR-absorbing seal. Alternately, the sealing layer may be patterned using a mask and etch process to form the IR-absorbing seal.
Public/Granted literature
- US20170174505A1 INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTION LAYER Public/Granted day:2017-06-22
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