- 专利标题: Photodetector having a tunable junction region doping profile configured to improve contact resistance performance
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申请号: US15867121申请日: 2018-01-10
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公开(公告)号: US10546971B2公开(公告)日: 2020-01-28
- 发明人: Joel P. de Souza , Ning Li , Devendra Sadana , Yao Yao
- 申请人: International Business Machines Corporation
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 代理机构: Cantor Colburn LLP
- 代理商 Vazken Alexanian
- 主分类号: H01L31/18
- IPC分类号: H01L31/18 ; H01L21/265 ; H01L31/0304 ; H01L21/266 ; H01L31/103
摘要:
Embodiments of the invention are directed to a method of forming a semiconductor device. A non-limiting example of the method includes forming a semiconductor material that includes a first type of majority carrier. A doping enhancement layer is formed over a region of the semiconductor material, wherein the doping enhancement layer includes a first type of material. A dopant is accelerated sufficiently to drive the dopant through the doping enhancement layer into the region of the semiconductor material. Accelerating the dopant through the doping enhancement layer also drives some of the first type of material from the doping enhancement layer into the region of the semiconductor material. The dopant within the region and the first type of material within the region contribute to the region having a second type of majority carrier.
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