- 专利标题: Resistance change memory device
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申请号: US15942236申请日: 2018-03-30
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公开(公告)号: US10535818B2公开(公告)日: 2020-01-14
- 发明人: Tae Jung Ha
- 申请人: SK hynix Inc.
- 申请人地址: KR Icheon
- 专利权人: SK HYNIX INC.
- 当前专利权人: SK HYNIX INC.
- 当前专利权人地址: KR Icheon
- 优先权: KR10-2017-0086682 20170707
- 主分类号: G11C11/16
- IPC分类号: G11C11/16 ; H01L45/00 ; G11C13/00
摘要:
A resistance change memory device is provided. The resistance change memory device includes a lower electrode, a tunneling barrier layer disposed on the lower electrode, a resistance switching layer disposed on the tunneling barrier layer, an oxygen vacancy reservoir layer disposed on the resistance switching layer, and an upper electrode disposed on the oxygen vacancy reservoir layer. The oxygen vacancy reservoir layer is electrically conductive.
公开/授权文献
- US20190013465A1 RESISTANCE CHANGE MEMORY DEVICE 公开/授权日:2019-01-10
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