- 专利标题: Sensing techniques for multi-level cells
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申请号: US16107280申请日: 2018-08-21
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公开(公告)号: US10535397B1公开(公告)日: 2020-01-14
- 发明人: Christopher John Kawamura , Scott James Derner
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Holland & Hart LLP
- 主分类号: G11C11/4091
- IPC分类号: G11C11/4091 ; G11C7/06 ; G11C11/408 ; G11C11/4076 ; G11C7/08 ; G11C11/4097 ; H01L27/108
摘要:
Techniques are provided for sensing a memory cell configured to store three or more states. A charge may be transferred between a digit line and a node coupled with a sense component using a charge transfer device. During a single read operation, multiple voltages may be applied to the gate of the charge transfer device. The node may be sensed a number of times based on a number of voltages applied to the gate of the charge transfer device. The charge may be transferred by the charge transfer device based on a value of the signal on a digit line and a voltage applied to the gate of the charge transfer device. Based on the charge being transferred and the sense component sensing the node multiple times, a logic state associated with the memory cell may be determined.
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