- 专利标题: Gate drive control system for SiC and IGBT power devices to control desaturation or short circuit faults
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申请号: US15767058申请日: 2016-10-20
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公开(公告)号: US10530353B2公开(公告)日: 2020-01-07
- 发明人: Albert J. Charpentier , Alan K. Smith , Nitesh Satheesh , Robin Weber
- 申请人: AGILESWITCH, LLC
- 申请人地址: US AZ Chandler
- 专利权人: MICROCHIP TECHNOLOGY INCORPORATED
- 当前专利权人: MICROCHIP TECHNOLOGY INCORPORATED
- 当前专利权人地址: US AZ Chandler
- 代理机构: RatnerPrestia
- 国际申请: PCT/US2016/057819 WO 20161020
- 国际公布: WO2017/070290 WO 20170427
- 主分类号: H03K17/60
- IPC分类号: H03K17/60 ; H03K17/04 ; H03K5/24 ; H03K3/012 ; H03K17/042 ; H03K21/08 ; H03K17/16
摘要:
A gate-drive controller for a power semiconductor device includes a master control unit (MCU) and one or more comparators that compare the output signal of the power semiconductor device to a reference value generated by the MCU. The MCU, in response to a turn-off trigger signal, generates a first intermediate drive signal for the power semiconductor device and generates a second intermediate drive signal, different from the first drive signal, when a DSAT signal indicates that the power semiconductor device is experiencing de-saturation. The MCU generates a final drive signal for the power semiconductor when the output signal of the one or more comparators indicates that the output signal of the power semiconductor device has changed relative to the reference value. The controller may also include a timer that causes the drive signals to change in predetermined intervals when the one or more comparators do not indicate a change.
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