- 专利标题： Damaging components with defective electrical couplings
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申请号： US16128353申请日： 2018-09-11
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公开(公告)号： US10529632B2公开(公告)日： 2020-01-07
- 发明人: Darrell D. Truhitte , James P. Letterman, Jr.
- 申请人： SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- 申请人地址： US AZ Phoenix
- 专利权人： SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- 当前专利权人： SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- 当前专利权人地址： US AZ Phoenix
- 代理机构： Adam R. Stephenson, Ltd.
- 主分类号： H01L21/66
- IPC分类号： H01L21/66 ; H01L21/268 ; H01L23/00
摘要：
A method, in some embodiments, comprises: providing a component having first and second electrical nodes; determining that the component lacks multiple, functional electrical couplings between said first and second nodes; damaging at least part of the component as a result of said determination; and determining, as a result of said damage, that the component is defective.
公开/授权文献
- US20190013249A1 DAMAGING COMPONENTS WITH DEFECTIVE ELECTRICAL COUPLINGS 公开/授权日：2019-01-10
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