发明授权
- 专利标题: Method and system for automated selection of a subset of plurality of validation tests
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申请号: US15978527申请日: 2018-05-14
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公开(公告)号: US10528691B1公开(公告)日: 2020-01-07
- 发明人: Meir Ovadia
- 申请人: Cadence Design Systems, Inc.
- 申请人地址: US CA San Jose
- 专利权人: Cadence Design Systems, Inc.
- 当前专利权人: Cadence Design Systems, Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: Pearl Cohen Zedek Latzer Baratz LLP
- 主分类号: G06F17/50
- IPC分类号: G06F17/50 ; G01R31/28
摘要:
A method for automated selection of a subset of a plurality of validation tests for testing a device under test (DUT), may include obtaining the plurality of validation tests; using a processor, obtaining from a user, via an input device, one or a plurality of conditions relating to one or a plurality of execution parameters; and using a processor, analyzing each of the validation tests to identify a subset of the validation tests that includes verification tests conforming to said one or a plurality of conditions.
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