- 专利标题: End face inspection device and focused image data acquisition method therefor
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申请号: US15920920申请日: 2018-03-14
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公开(公告)号: US10521922B2公开(公告)日: 2019-12-31
- 发明人: Ryota Takasu
- 申请人: ANRITSU CORPORATION
- 申请人地址: JP Kanagawa
- 专利权人: ANRITSU CORPORATION
- 当前专利权人: ANRITSU CORPORATION
- 当前专利权人地址: JP Kanagawa
- 代理机构: Pearne & Gordon LLP
- 优先权: JP2017-060985 20170327
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06T7/571 ; G06T7/00 ; G01M11/00 ; G06T7/70
摘要:
Provided is an end face inspection device capable of inspecting different end face shapes without replacing an adapter for attachment. An end face inspection device includes: an optical system that forms an image of an end face of a test object, which is fixed at a predetermined position, at a position of an image sensor; and a focus detection section that acquires image data, which is output by the image sensor, and determines whether or not the end face is brought into focus in the image data. The focus detection section acquires a plurality of the image data pieces, in which parts of the end face are brought into focus by changing a focal position of the optical system by a predetermined distance at a time, and acquires focused image data by synthesizing the respective parts brought into focus in the plurality of image data pieces.
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