- 专利标题: Distributed analysis x-ray inspection methods and systems
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申请号: US16248547申请日: 2019-01-15
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公开(公告)号: US10509142B2公开(公告)日: 2019-12-17
- 发明人: Shehul Sailesh Parikh , Balamurugan Sankaranarayanan , Jeffrey Bryan Abel , Siva Kumar , Joseph Bendahan
- 申请人: Rapiscan Systems, Inc.
- 申请人地址: US CA Torrance
- 专利权人: Rapiscan Systems, Inc.
- 当前专利权人: Rapiscan Systems, Inc.
- 当前专利权人地址: US CA Torrance
- 代理机构: Novel IP
- 主分类号: G01V5/00
- IPC分类号: G01V5/00 ; G08B13/194 ; G06T7/00 ; G06Q10/08
摘要:
The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning. Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the contents of cargo. In case of a mismatch between cargo contents shown by manifest data and the X-ray images, the cargo may be withheld for further inspection. In one embodiment, the process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated.
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