Invention Grant
- Patent Title: Measurement instrument and reflection device used for same
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Application No.: US15858518Application Date: 2017-12-29
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Publication No.: US10467991B2Publication Date: 2019-11-05
- Inventor: Atsuya Niwano
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kawasaki
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kawasaki
- Agency: Oliff PLC
- Priority: JP2017-012483 20170126
- Main IPC: G09G5/38
- IPC: G09G5/38 ; G02B7/182 ; G06F3/147 ; G02B5/08 ; G02B27/04
Abstract:
A measurement instrument includes a display configured to display information; a display controller configured to control displaying of the information on the display; and a reflector configured to invert the information displayed on the display via specular reflection. Since the measurement instrument includes the reflector configured to invert the information displayed on the display via specular reflection, information can be seen via the reflector even when the information is difficult to read directly from the display. Thus, the measurement instrument can improve visibility of the information displayed on the display.
Public/Granted literature
- US20180211637A1 MEASUREMENT INSTRUMENT AND REFLECTION DEVICE USED FOR SAME Public/Granted day:2018-07-26
Information query
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