- 专利标题: Vertical transistors with improved top source/drain junctions
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申请号: US15406022申请日: 2017-01-13
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公开(公告)号: US10396208B2公开(公告)日: 2019-08-27
- 发明人: Kangguo Cheng , Muthumanickam Sankarapandian , Ruilong Xie , Tenko Yamashita , Chun-Chen Yeh
- 申请人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 代理机构: Cantor Colburn LLP
- 代理商 Vazken Alexanian
- 主分类号: H01L21/8234
- IPC分类号: H01L21/8234 ; H01L29/786 ; H01L29/423 ; H01L29/66 ; H01L21/306
摘要:
A method of fabricating a top source/drain junction of a vertical transistor includes forming a structure including a bottom source/drain, a fin channel extending vertically from the bottom source/drain, and a gate arranged around the fin channel, the gate including a dielectric layer, a gate metal, and spacers arranged on top and bottom surfaces of the gate; etching to form a recess in a top surface of the fin, the recess having sidewalls that form oblique angles with respect to sidewalls of the fin; forming a top source/drain on the fin and within the recess; doping the top source/drain with a dopant; and annealing to diffuse the dopants from the top source/drain into the fin.
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