- Patent Title: Appearance inspection apparatus and appearance inspection method
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Application No.: US15901506Application Date: 2018-02-21
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Publication No.: US10379035B2Publication Date: 2019-08-13
- Inventor: Akihiro Noda , Hiroya Kusaka , Taro Imagawa , Shunsuke Yasugi
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2016-062995 20160328
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G01N21/27 ; G06T7/90 ; G01N21/84 ; G06T7/00 ; H04N5/235 ; G01N21/25 ; G01N21/47 ; H04N5/225 ; H04N5/232 ; H04N9/04 ; H04N9/64 ; G06T7/13 ; G01N33/02

Abstract:
An appearance inspection apparatus includes a lighting unit, an imaging unit, a memory, an operating unit, a detecting unit, and a determination unit. The lighting unit has a plurality of light sources emitting single-wavelength light with relative spectral distributions different from one another, and substantially simultaneously irradiates a photographic subject with illumination light. The imaging unit captures light discharged by the photographic subject. The memory stores information about sensitivity characteristics of the imaging unit for each color. The operating unit separates an image into a first, a second, and a third image, for each component of the single-wavelength light, using the information. The detecting detects information about a specific area of the photographic subject using the first and the second image. The determination unit extracts an amount of image characteristics corresponding to a characteristic part present in the specific area using the first and the third image.
Public/Granted literature
- US20180180534A1 APPEARANCE INSPECTION APPARATUS AND APPEARANCE INSPECTION METHOD Public/Granted day:2018-06-28
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